发明名称 Algorithmic reactive testbench for analog designs
摘要 An Algorithmic Reactive Testbench (ART) system is provided for the simulation/verification of an analog integrated circuit design. The ART system is a high level simulation/verification environment with a user program in which one or more analog testbenches are instantiated and operated as prescribed in an algorithmic reactive testbench program, and the properties of the unit testbenches (test objects) can be influenced by prior analysis of themselves or other tests. The test object may also contain various properties including information reflecting the status of the test object. The modification of a property of a test object is an act of communication in the ART system from the algorithmic reactive testbench program to the test object.
申请公布号 US7853908(B2) 申请公布日期 2010.12.14
申请号 US20070899215 申请日期 2007.09.05
申请人 NATIONAL SEMICONDUCTOR CORPORATION 发明人 KIM JANG DAE;MARTINEZ STEVE A.;MISHRA SATYA N.;BUCHOLZ ALAN P.;LI HUI X.;BERIGEI RAJESH R.
分类号 G06F17/50;G06F9/45 主分类号 G06F17/50
代理机构 代理人
主权项
地址