发明名称 SUBSTRATE FOR GROWING GROUP-III NITRIDE SEMICONDUCTOR, EPITAXIAL SUBSTRATE FOR GROUP-III NITRIDE SEMICONDUCTOR, GROUP-III NITRIDE SEMICONDUCTOR ELEMENT, STAND-ALONE SUBSTRATE FOR GROUP-III NITRIDE SEMICONDUCTOR, AND METHODS FOR MANUFACTURING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide an epitaxial substrate for group-III nitride semiconductors, a group-III nitride semiconductor element, and a stand-alone substrate for group-III nitride semiconductors, which produce good crystallinity not only for materials having growth temperatures at or below 1050&deg;C, such as AlGaN, GaN, and GaInN, but also for high-Al Al<SB>x</SB>Ga<SB>1-x</SB>N compositions having high growth temperatures, and also to provide a substrate for growing group-III nitride semiconductors, for fabricating the same, and a method for efficient fabrication thereof. <P>SOLUTION: These are characterized by being provided with a crystal growth substrate, at least the surface region of which includes an aluminum-containing group-III nitride semiconductor, and a scandium nitride film formed on top of the surface region. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2010278470(A) 申请公布日期 2010.12.09
申请号 JP20100191049 申请日期 2010.08.27
申请人 DOWA HOLDINGS CO LTD;DOWA ELECTRONICS MATERIALS CO LTD 发明人 TOBA RYUICHI
分类号 H01L21/20;H01L21/205;H01L33/32 主分类号 H01L21/20
代理机构 代理人
主权项
地址