发明名称 |
OPTICAL CHARACTERISTIC INSPECTION SYSTEM, AND INSPECTION METHOD USING SAME |
摘要 |
The present invention relates to an optical characteristic inspection system and to an inspection method, which enable the inspection of the quality of a manufactured light source in a quick and accurate manner. For this purpose, the present invention provides an optical characteristic inspection system comprising: a plurality of color sensors which are arranged to correspond to respective light sources to be inspected, and which measure light emitted from the light sources to be inspected in a defined area; a control unit, which calculates the values of the characteristics of the light sources to be inspected on the basis of the data measured by the color sensors; and an installation unit which carries a light source module wherein the light sources to be inspected are arrayed at a predetermined spacing, and fixes the light sources to be inspected at the respective positions corresponding to the respective color sensors. The present invention also provides an inspection method. |
申请公布号 |
WO2010104291(A3) |
申请公布日期 |
2010.12.09 |
申请号 |
WO2010KR01401 |
申请日期 |
2010.03.05 |
申请人 |
WITHLIGHT CO.LTD.;PARK, SUNG LIM;LEE, HYEON HEE;CHO, JAE BONG;KIM, YOUNG GON |
发明人 |
PARK, SUNG LIM;LEE, HYEON HEE;CHO, JAE BONG;KIM, YOUNG GON |
分类号 |
G01J1/02 |
主分类号 |
G01J1/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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