发明名称 OPTICAL CHARACTERISTIC INSPECTION SYSTEM, AND INSPECTION METHOD USING SAME
摘要 The present invention relates to an optical characteristic inspection system and to an inspection method, which enable the inspection of the quality of a manufactured light source in a quick and accurate manner. For this purpose, the present invention provides an optical characteristic inspection system comprising: a plurality of color sensors which are arranged to correspond to respective light sources to be inspected, and which measure light emitted from the light sources to be inspected in a defined area; a control unit, which calculates the values of the characteristics of the light sources to be inspected on the basis of the data measured by the color sensors; and an installation unit which carries a light source module wherein the light sources to be inspected are arrayed at a predetermined spacing, and fixes the light sources to be inspected at the respective positions corresponding to the respective color sensors. The present invention also provides an inspection method.
申请公布号 WO2010104291(A3) 申请公布日期 2010.12.09
申请号 WO2010KR01401 申请日期 2010.03.05
申请人 WITHLIGHT CO.LTD.;PARK, SUNG LIM;LEE, HYEON HEE;CHO, JAE BONG;KIM, YOUNG GON 发明人 PARK, SUNG LIM;LEE, HYEON HEE;CHO, JAE BONG;KIM, YOUNG GON
分类号 G01J1/02 主分类号 G01J1/02
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