发明名称 OPTICAL INSPECTION SYSTEM
摘要 <p>Optical inspection system for inspecting objects on or in an essentially plane surface, the inspection system comprising a first and a second inspection units, each inspection unit comprising a light source unit emitting light through at least one beam splitter toward the objects to be inspected, and an interferometer positioned between the beam splitter and the object, the interferometer unit comprising at least one interferometer using a reference beam and a measuring beam, the measuring beam being aimed at and reflected from the object, the return signal propagating through the beam splitter to a sensor unit.</p>
申请公布号 WO2010139764(A1) 申请公布日期 2010.12.09
申请号 WO2010EP57789 申请日期 2010.06.03
申请人 SINTEF;GASTINGER, KAY;HAUGHOLT, KARL, H.;KUJAWINSKA, MALGORZATA;ZEITNER, UWE;GORECKI, CHRISTOPHE;JOZWIK, MICHAL 发明人 GASTINGER, KAY;HAUGHOLT, KARL, H.;KUJAWINSKA, MALGORZATA;ZEITNER, UWE;GORECKI, CHRISTOPHE;JOZWIK, MICHAL
分类号 G01N21/95 主分类号 G01N21/95
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