发明名称 TEST AND MEASUREMENT INSTRUMENT WITH BIT-ERROR DETECTION
摘要 PURPOSE: An inspecting and measuring instrument having the bit error detect function is provided to remove the error from the digital data to be displayed. CONSTITUTION: An input unit(12) outputs the digital data(14) by receiving the signal. A memory(18) stores the standard digital data(22) including the reference sequence. A pattern detector(16) detects the reference sequence out of the digital data and generates a synchronized signal(20) in response to the reference sequence.
申请公布号 KR20110016835(A) 申请公布日期 2011.02.18
申请号 KR20100077299 申请日期 2010.08.11
申请人 TEKTRONIX, INC. 发明人 TRAN QUE THUY
分类号 G01R15/12;G01R13/00;G01R31/3193 主分类号 G01R15/12
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