发明名称 Method of detecting defects on an object
摘要 A method for detecting defects on an object includes an illumination optical unit which obliquely projects a laser focused onto a line on a surface of the object and white-color, a table unit which mounts the specimen and which is movable, a detection optical unit which detects with an image sensor an image of light formed by light reflected from the object and passed through a filter which blocks diffraction light resulting from patterns formed on the object, a signal processor which processes a signal outputted from the image sensor of the detection optical unit to extract defects of the object, and a display unit which displays information of defects extracted by the signal processor. The filter is adjustable.
申请公布号 US7940383(B2) 申请公布日期 2011.05.10
申请号 US20090630307 申请日期 2009.12.03
申请人 HITACHI, LTD.;HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 NOGUCHI MINORI;OHSHIMA YOSHIMASA;NISHIYAMA HIDETOSHI;MATSUMOTO SHUNICHI;KEMBO YUKIO;MATSUNAGA RYOUJI;SAKAI KEIJI;NINOMIYA TAKANORI;WATANABE TETSUYAI;NAKAMURA HISATO;JINGU TAKAHIRO;MORISHIGE YOSHIO;CHIKAMATSU SHUICHI
分类号 G01N21/00;G01N21/94;G01N21/95;G01N21/956;G01R31/308;H01J37/00;H01L21/00;H01L21/66;H01L21/68 主分类号 G01N21/00
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