发明名称 PATTERN FORMING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a nano imprint type pattern forming method which suppresses generation of defects. SOLUTION: The pattern forming method includes: a measurement process (a step S110) for measuring wettability of a surface of a template 10 having projections and recesses 12 on a transfer surface 10a; and a determination process (a step S115) for determining whether to transfer the projection and recess pattern on a transfer material 30 or not by contacting the transfer surface of the template on the transfer material 30 arranged on a main surface 20a of the substrate 20, based on a measurement result of wettability. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011096708(A) 申请公布日期 2011.05.12
申请号 JP20090246303 申请日期 2009.10.27
申请人 TOSHIBA CORP 发明人 OTA TAKUMI
分类号 H01L21/027;B29C59/02 主分类号 H01L21/027
代理机构 代理人
主权项
地址