发明名称 Method of fabricating a semiconductor device
摘要 A method for fabricating a semiconductor device. A preferred embodiment comprises forming a via in a semiconductor substrate, filling the via with a disposable material such as amorphous carbon, forming a dielectric layer on the substrate covering the via, performing a back side etch to expose the disposable material in the via. A back side dielectric layer is then depositing, covering the exposed via. A small opening is then formed, and the disposable material is removed, for example by an isotropic etch process. The via may now be filled with a metal and used as a conductor or a dielectric material. The via may also be left unfilled to be used as an air gap.
申请公布号 US7960290(B2) 申请公布日期 2011.06.14
申请号 US20070799637 申请日期 2007.05.02
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 YU CHEN-HUA;CHIOU WEN-CHIH;WU WENG-JIN
分类号 H01L23/522 主分类号 H01L23/522
代理机构 代理人
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