| 摘要 |
PROBLEM TO BE SOLVED: To provide a device for cleaning a tester interface contact element and a supporting hardware. SOLUTION: The medium for predictably cleaning the contact elements and support hardware of a tester interface, such as a probe card or a test socket, while it is still in manual, semi-automated, and automated handling device and the electrical test equipment are disclosed so that the function and performance of the individual die or IC package may be electrically evaluated. COPYRIGHT: (C)2011,JPO&INPIT |
