发明名称 OPERATION PROCESSING DEVICE OR METHOD FOR INSPECTING STICKING STATE OF ACF, OR LINE OR METHOD FOR ASSEMBLING DISPLAY SUBSTRATE MODULE
摘要 PROBLEM TO BE SOLVED: To provide a processing operation device or a method for inspecting a sticking state of an ACF, capable of reducing the total operation time of a processing operation for sticking the ACF and an inspection operation of the sticking state of the ACF, or capable of reducing a processing operation device length required for sticking the ACF, or to provide a line and method for assembling a display substrate module, capable of reducing a cycle time for assembling the display substrate module or achieving reduced line length. SOLUTION: When an ACF 3 stuck on a predetermined position of a side of a display substrate P conveyed by a conveyance unit is imaged to inspect a sticking state of an ACF, the display substrate P is imaged during conveyance after sticking the ACF 3, fluctuation in an ACF image obtained by imaging during the conveyance is corrected, and an imaging unit images an imaging region SH including the ACF 3 stuck on the predetermined position. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011124391(A) 申请公布日期 2011.06.23
申请号 JP20090280944 申请日期 2009.12.10
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 EBISAWA KEIICHI;TAMAMOTO JUNICHI;AKIBA YUJI;HISA TAKAFUMI;TAKEDA MASAOMI;KATAHO HIDEAKI;DOI HIDEAKI;SAITO YOSHIHIRO
分类号 H05K13/08;G02F1/13;G02F1/1345;H01L21/60 主分类号 H05K13/08
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