发明名称 Semiconductor processing methods, and methods for forming silicon dioxide
摘要 Some embodiments include methods for semiconductor processing. A semiconductor substrate may be placed within a reaction chamber. The semiconductor substrate may have an inner region and an outer region laterally outward of said inner region, and may have a deposition surface that extends across the inner and outer regions. The semiconductor substrate may be heated by radiating thermal energy from the outer region to the inner region. The heating may eventually achieve thermal equilibrium. However, before thermal equilibrium of the outer and inner regions is reached, and while the outer region is warmer than the inner region, at least two reactants are sequentially introduced into the reaction chamber. The reactants may together form a single composition on the deposition surface through a quasi-ALD process.
申请公布号 US7989360(B2) 申请公布日期 2011.08.02
申请号 US20080970369 申请日期 2008.01.07
申请人 MICRON TECHNOLOGY, INC. 发明人 SURTHI SHYAM
分类号 H01L21/31 主分类号 H01L21/31
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