发明名称 |
Method and apparatus for inspecting components |
摘要 |
A method for inspecting a component is provided. The method includes generating an image of the component, generating a signal indication mask, and generating a noise mask using a signal within the signal indication mask. The noise mask facilitates reducing a quantity of prospective signals contained in the signal indication mask. The method further includes utilizing the signal indication mask and the generated noise mask to calculate the signal-to-noise ratio of at least one potential flaw indication that may be present in the image.
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申请公布号 |
US7995829(B2) |
申请公布日期 |
2011.08.09 |
申请号 |
US20070832442 |
申请日期 |
2007.08.01 |
申请人 |
GENERAL ELECTRIC COMPANY |
发明人 |
FERRO ANDREW FRANK;HOWARD PATRICK JOSEPH |
分类号 |
G06K9/00;G01B17/02;G21G5/00 |
主分类号 |
G06K9/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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