| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To generate a waveform test signal having the crest factor emulation of a random jitter. <P>SOLUTION: A CPU 60 generates a user interface on a display unit 56 and sets a parameter for a serial data pattern and parameters for a data ministick jitter defect given to the serial data pattern, a random jitter defect, and a random jitter defect and at least one deviation crest factor emulation defect. Using these parameters, a waveform record file is generated to keep a deviation crest factor emulation defect selectively positioned in the defect serial data pattern. A waveform generation circuit 70 generates a defective serial data pattern analog output signal based on the defects. A displaced crest factor emulation defect is selectively positioned at the defective serial data pattern analog output signal. <P>COPYRIGHT: (C)2011,JPO&INPIT</p> |
