发明名称 |
METHOD OF POLISHING SUBSTRATE CONTAINING POLYSILICON AND AT LEAST ONE OF SILICON OXIDE AND SILICON NITRIDE |
摘要 |
PROBLEM TO BE SOLVED: To provide a chemical mechanical polishing composition that improves a polishing selection ratio of a silicon oxide or a silicon nitride with respect to polysilicon, and a polishing method using the same.SOLUTION: A substrate contains polysilicon and at least one of a silicon oxide and a silicon nitride. The substrate is polished by using a chemical mechanical polishing composition and a polishing pad. The chemical mechanical polishing composition contains, as initial components, water, an abrasive, and an alkyl aryl polyether sulfonate compound including a hydrophobic portion with an alkyl group bound to an aryl ring and a nonionic acyclic hydrophilic portion having 4 to 100 carbon atoms. |
申请公布号 |
JP2011205097(A) |
申请公布日期 |
2011.10.13 |
申请号 |
JP20110052898 |
申请日期 |
2011.03.10 |
申请人 |
ROHM & HAAS ELECTRONIC MATERIALS CMP HOLDINGS INC |
发明人 |
GUO YI;LIU ZHENDONG;REDDY KANCHARLA-ARUN KUMAR;ZHANG GUANGYUN |
分类号 |
H01L21/304;B24B37/00;B24B37/04;C09K3/14 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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