发明名称 METHOD OF POLISHING SUBSTRATE CONTAINING POLYSILICON AND AT LEAST ONE OF SILICON OXIDE AND SILICON NITRIDE
摘要 PROBLEM TO BE SOLVED: To provide a chemical mechanical polishing composition that improves a polishing selection ratio of a silicon oxide or a silicon nitride with respect to polysilicon, and a polishing method using the same.SOLUTION: A substrate contains polysilicon and at least one of a silicon oxide and a silicon nitride. The substrate is polished by using a chemical mechanical polishing composition and a polishing pad. The chemical mechanical polishing composition contains, as initial components, water, an abrasive, and an alkyl aryl polyether sulfonate compound including a hydrophobic portion with an alkyl group bound to an aryl ring and a nonionic acyclic hydrophilic portion having 4 to 100 carbon atoms.
申请公布号 JP2011205097(A) 申请公布日期 2011.10.13
申请号 JP20110052898 申请日期 2011.03.10
申请人 ROHM & HAAS ELECTRONIC MATERIALS CMP HOLDINGS INC 发明人 GUO YI;LIU ZHENDONG;REDDY KANCHARLA-ARUN KUMAR;ZHANG GUANGYUN
分类号 H01L21/304;B24B37/00;B24B37/04;C09K3/14 主分类号 H01L21/304
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