发明名称 SOLID-STATE IMAGING DEVICE AND TEST CHART
摘要 PROBLEM TO BE SOLVED: To correct misalignment and distortion of an image output from a solid-state imaging device.SOLUTION: A correction parameter register 9 stores a correction parameter used in an image position correction circuit 6. The image position correction circuit 6 corrects the position of captured images by pixel, on the basis of the correction parameter stored in a correction parameter register 9. The solid-state imaging device includes a lens-barrel integrally holding an image sensor and lenses. A test chart includes a first pattern having pixels adjacent in at least three directions, a second pattern point-symmetrical to the first pattern, and an outer-frame pattern arranged around the first pattern and the second pattern.
申请公布号 JP2011205288(A) 申请公布日期 2011.10.13
申请号 JP20100069345 申请日期 2010.03.25
申请人 TOSHIBA CORP 发明人 HIDAKA KIYOSHI
分类号 H04N5/232;H01L27/14 主分类号 H04N5/232
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