发明名称 |
METHOD AND SYSTEM FOR OBTAINING ATTITUDE OF PROBE RELATIVE TO OBJECT BY PROBING THE OBJECT USING THE PROBE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method and system for obtaining an attitude of a probe relative to an object by probing the object using the probe. <P>SOLUTION: The method for obtaining an attitude of a probe relative to an object includes: a step which uses Rao-Blackwellized particle filtering to obtain a probability of the attitude, in a probability of a location of the attitude is represented by locations 212 of particles and a probability of an orientation of the attitude is represented by a Gaussian distribution 215 over orientations of particles conditional on locations of respective particles, and is executed for each following probing till the probability of the attitude is concentrated around a specific attitude; and a step which estimates the attitude of the probe relative to the object on the basis of the specific attitude. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2011221008(A) |
申请公布日期 |
2011.11.04 |
申请号 |
JP20110052794 |
申请日期 |
2011.03.10 |
申请人 |
MITSUBISHI ELECTRIC RESEARCH LABORATORIES INC |
发明人 |
TAGUCHI YUICHI;TIM K MARKS |
分类号 |
G01B21/22;B25J19/02;G01B21/20 |
主分类号 |
G01B21/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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