发明名称 MEASURING METHOD FOR LASER DIODE
摘要 <P>PROBLEM TO BE SOLVED: To automatically measure a large number of laser diodes individually against multiple temperature ranges. <P>SOLUTION: Eight work-piece receiver holders are provided at 45 degrees pitch in the peripheral line vicinity of a round index table whose each rotation angle is 45 degrees, and the holders are alternately for high temperature and medium temperature measurement. A feed section of the work-piece is a particular location of the holders, and a test section is the sixth location counted in the rotation direction from the feed section. Firstly, a first work-piece is provided to the holder located at the feed section and turned twice at 45 degrees, and a second work-piece is provided to the holder located at the feed section, and when the measurement for the first work-piece finishes at the test section at high temperature or medium temperature it transfers to a holder at temperature different from that of the measured and front adjoining one in the rotation direction. Measurement is performed once again at the test section at different temperature, and when measurement finishes, the first work-piece is picked up and received at the location front adjoining to the test section in rotation direction and stored. This work is repeated as many times as the number of work-pieces. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011220704(A) 申请公布日期 2011.11.04
申请号 JP20100086739 申请日期 2010.04.05
申请人 ARUFAKUSU KK 发明人 ISHIZUKA SHIZUKA;SHIRAISHI YOJI;NAKAYAMA TAIICHIRO
分类号 G01R31/26 主分类号 G01R31/26
代理机构 代理人
主权项
地址