| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an X-ray imaging apparatus capable of adjusting the sensitivity easily or an X-ray imaging apparatus capable of extracting an amount of X-ray refraction easily. <P>SOLUTION: An X-ray imaging apparatus for imaging an object to be measured 103 by irradiating the object to be measured 103 with an X-ray beam emitted from an X-ray source which generates an X-ray of a first energy and an X-ray of a second energy different from the X-ray of the first energy comprises an attenuator 104 and a detector 105. The attenuator 104 attenuates the X-ray beam that has passed through the object to be measured 103 such that an amount of attenuated X-ray varies according to the incident position of the X-ray. The detector 105 detects the X-ray beam that has passed through the attenuator 104 to detect the X-ray of the first energy and the X-ray of the second energy. <P>COPYRIGHT: (C)2012,JPO&INPIT |
