发明名称 SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a structure which suppresses deterioration of humidity resistance and improves heat resistance of a semiconductor device. <P>SOLUTION: The semiconductor device includes semiconductor elements 1a and 1b mounted on a heat spreader 3, lead frames 5a and 5b, which respectively connect to the semiconductor elements 1a and 1b, and a mold resin 6 holding the lead frames 5a and 5b and forming a case. Upper portions and side surfaces of the semiconductor elements 1a and 1b are covered by an organic thin film 8 formed between the semiconductor elements 1a and 1b and the mold resin 6. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012004282(A) 申请公布日期 2012.01.05
申请号 JP20100136940 申请日期 2010.06.16
申请人 MITSUBISHI ELECTRIC CORP 发明人 KATO HAJIME
分类号 H01L23/34 主分类号 H01L23/34
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