发明名称
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device containing a solid-state image pickup element for forming a mask on a region exceeding the limit of mask fining, reducing the number of processes, and improving reliability, and also to provide a method for manufacturing the semiconductor device. SOLUTION: The semiconductor device has an element separation region 23 by an impurity region, and a mask 29 for obstructing ion implantation remains on the element separation region 23. A mask 29 for obstructing ion implantation is formed with the component of a semiconductor element, for example with the same configuration as a gate control section 25 in a MOS transistor. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP4892836(B2) 申请公布日期 2012.03.07
申请号 JP20050025527 申请日期 2005.02.01
申请人 发明人
分类号 H01L27/146;H01L21/761;H01L27/08;H01L29/78;H04N5/335;H04N5/359;H04N5/369;H04N5/374 主分类号 H01L27/146
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