发明名称 |
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE |
摘要 |
<p>PURPOSE: A semiconductor integrated circuit device is provided to control a threshold voltage of a MISFET in a corresponding part by introducing impurities in a back gate semiconductor region. CONSTITUTION: A semiconductor chip(2) is formed on a P-type single crystal silicon substrate(1s). An SOI region(8) is formed on a first main surface(1a) of the semiconductor chip. A first N channel MISFET(Metal Insulator Semiconductor Field Effect Transistor) region(8n) and a first P channel MISFET region(8p) are formed within the SOI(Silicon On Insulator Region). A first gate insulating layer(35sn) and a first gate electrode film(36sn) are formed within the first N channel MISFET region. A second gate insulating layer(35sp) and a second gate electrode film(36sp) are formed within the first P channel MISFET region.</p> |
申请公布号 |
KR20120066599(A) |
申请公布日期 |
2012.06.22 |
申请号 |
KR20110133651 |
申请日期 |
2011.12.13 |
申请人 |
RENESAS ELECTRONICS CORPORATION |
发明人 |
IWAMATSU TOSHIAKI |
分类号 |
H01L27/085;H01L21/336;H01L29/78 |
主分类号 |
H01L27/085 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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