| 摘要 |
PURPOSE: A device for measuring a whiteness index and a method using the same are provided to accurately measure a whiteness index of a steel plate without contacts and to control a surface of a steel plate to be in an optimal condition by monitoring a processing condition of the steel plate on a real time basis. CONSTITUTION: A device for measuring a whiteness index comprises a measurement head(10), a light source(30), a spectrometer(40), and a computing device(50). The measurement head comprising a light emitting unit and detection unit is spaced from a measurement object steel plate. The light source is connected to the light emitting unit, thereby providing lights in UV-visible ray region to the light emitting unit. The spectrometer is connected to the detection unit, thereby analyzing spectra of reflective lights sensed by the detection unit and computing an integrated intensity of a spectrum. The computing device is connected to the spectrometer and computes a whiteness index of the measurement object steel plate by using a relational expression of the integrated intensity and a preset whiteness index by actual measurement.
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