发明名称 MONITORING DEVICE AND MONITORING SYSTEM
摘要 <P>PROBLEM TO BE SOLVED: To facilitate inquiries into the cause for trouble that has occurred to an LSI or the like. <P>SOLUTION: A monitoring device 100 is arranged within or near an LSI, a frequency counter 20 measures within the monitoring device 100 the oscillation frequency of a ring oscillator 10 within a certain length of time and generates oscillation frequency information indicating the measured oscillation frequency, a time counter 30 generates time information representing the time at which the frequency counter 20 measured the oscillation frequency, an output controller 80 associates the oscillation frequency information and the time information with each other and outputs them to a memory unit 90, and the memory unit 90 stores the oscillation frequency information and the time information as log items. By observing in this way the transition of the oscillation frequency from the time the LSI was actuated until the occurrence of trouble, relative variations of delays can be checked, and inquiries into the cause for trouble can be facilitated without worrying about individual differences among different LSI units. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012154809(A) 申请公布日期 2012.08.16
申请号 JP20110014379 申请日期 2011.01.26
申请人 MITSUBISHI ELECTRIC CORP 发明人 YAMAZAKI AKIKO
分类号 G01R31/28 主分类号 G01R31/28
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