摘要 |
<P>PROBLEM TO BE SOLVED: To provide a terahertz wave spectroscopic measurement device capable of suppressing an influence caused by heating/cooling of a measuring object in a total internal reflection prism including a terahertz wave generating element integrated with a terahertz wave detecting element. <P>SOLUTION: In the terahertz wave spectroscopic measurement device according to the present invention, a total internal reflection prism 31 includes: a first prism section 31f including a total reflection surface 31c; a body section 31g to which a terahertz wave generating element 32 and a terahertz wave detecting element 33 are integrally fixed; and a heat insulating material 31h interposed in a fitting portion between the first prism section 31f and the body section 31g. Therefore, it is unlikely to transmit a temperature change when heating/cooling a measured object 34, from the first prism section 31f to the body section 31g. Consequently, this constitution can prevent the temperature change from excessively transmitting to the terahertz wave generating element 32 and the terahertz wave detecting element 33. <P>COPYRIGHT: (C)2013,JPO&INPIT |