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经营范围
发明名称
PROBE WAFER, PROBE DEVICE, AND TESTING SYSTEM
摘要
申请公布号
KR101204109(B1)
申请公布日期
2012.11.23
申请号
KR20107013847
申请日期
2008.03.26
申请人
发明人
分类号
H01L21/66
主分类号
H01L21/66
代理机构
代理人
主权项
地址
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