发明名称 TESTING DEVICE AND TESTING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To execute testing accurately. <P>SOLUTION: A testing device provided in the present invention tests a device under test that outputs a data signal and a clock signal which shows timing for sampling the data signal, and the testing device comprises: a data acquisition part for acquiring the data signal output by the device under test in accordance with the timing corresponding to the clock signal output by the device under test; a mask part for masking the data acquisition by the data acquisition part in a period when the device under test does not output the clock signal; and a determination part for determining the quality of the device under test on the basis of a result of comparing the data signal acquired by the data acquisition part with an expectation value. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012247318(A) 申请公布日期 2012.12.13
申请号 JP20110119660 申请日期 2011.05.27
申请人 ADVANTEST CORP 发明人 OSHIMA HIROMI
分类号 G01R31/319 主分类号 G01R31/319
代理机构 代理人
主权项
地址