发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 An object of an embodiment of the present invention is to provide a semiconductor device which includes a transistor including an oxide semiconductor with high field-effect mobility, a small variation in threshold voltage, and high reliability. The semiconductor device includes a transistor which includes an insulating substrate from which oxygen is released by heat treatment and an oxide semiconductor film over the insulating substrate. A channel is formed in the oxide semiconductor film. The insulating substrate from which oxygen is released by heat treatment can be manufactured by implanting oxygen ions into at least a region of an insulating substrate on the side provided with the oxide semiconductor film.
申请公布号 US2013009149(A1) 申请公布日期 2013.01.10
申请号 US201213540029 申请日期 2012.07.02
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD.;ENDO YUTA;KOEZUKA JUNICHI;SATO YUICHI 发明人 ENDO YUTA;KOEZUKA JUNICHI;SATO YUICHI
分类号 H01L29/786;H01L21/425 主分类号 H01L29/786
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