发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF |
摘要 |
An object of an embodiment of the present invention is to provide a semiconductor device which includes a transistor including an oxide semiconductor with high field-effect mobility, a small variation in threshold voltage, and high reliability. The semiconductor device includes a transistor which includes an insulating substrate from which oxygen is released by heat treatment and an oxide semiconductor film over the insulating substrate. A channel is formed in the oxide semiconductor film. The insulating substrate from which oxygen is released by heat treatment can be manufactured by implanting oxygen ions into at least a region of an insulating substrate on the side provided with the oxide semiconductor film.
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申请公布号 |
US2013009149(A1) |
申请公布日期 |
2013.01.10 |
申请号 |
US201213540029 |
申请日期 |
2012.07.02 |
申请人 |
SEMICONDUCTOR ENERGY LABORATORY CO., LTD.;ENDO YUTA;KOEZUKA JUNICHI;SATO YUICHI |
发明人 |
ENDO YUTA;KOEZUKA JUNICHI;SATO YUICHI |
分类号 |
H01L29/786;H01L21/425 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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