发明名称 Memory board with self-testing capability
摘要 A self-testing memory module includes a printed circuit board configured to be operatively coupled to a memory controller of a computer system and includes a plurality of memory devices on the printed circuit board, each memory device of the plurality of memory devices comprising data, address, and control ports. The memory module also includes a control module configured to generate address and control signals for testing the memory devices. The memory module includes a data module comprising a plurality of data handlers. Each data handler is operable independently from each of the other data handlers of the plurality of data handlers. Each data handler is operatively coupled to a corresponding plurality of the data ports of one or more of the memory devices and is configured to generate data for writing to the corresponding plurality of data ports.
申请公布号 US8359501(B1) 申请公布日期 2013.01.22
申请号 US201113183253 申请日期 2011.07.14
申请人 NETLIST, INC.;LEE HYUN;BHAKTA JAYESH R.;CHOI SOONJU 发明人 LEE HYUN;BHAKTA JAYESH R.;CHOI SOONJU
分类号 G11C29/00 主分类号 G11C29/00
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