发明名称 |
Memory board with self-testing capability |
摘要 |
A self-testing memory module includes a printed circuit board configured to be operatively coupled to a memory controller of a computer system and includes a plurality of memory devices on the printed circuit board, each memory device of the plurality of memory devices comprising data, address, and control ports. The memory module also includes a control module configured to generate address and control signals for testing the memory devices. The memory module includes a data module comprising a plurality of data handlers. Each data handler is operable independently from each of the other data handlers of the plurality of data handlers. Each data handler is operatively coupled to a corresponding plurality of the data ports of one or more of the memory devices and is configured to generate data for writing to the corresponding plurality of data ports.
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申请公布号 |
US8359501(B1) |
申请公布日期 |
2013.01.22 |
申请号 |
US201113183253 |
申请日期 |
2011.07.14 |
申请人 |
NETLIST, INC.;LEE HYUN;BHAKTA JAYESH R.;CHOI SOONJU |
发明人 |
LEE HYUN;BHAKTA JAYESH R.;CHOI SOONJU |
分类号 |
G11C29/00 |
主分类号 |
G11C29/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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