| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a device and a method capable of performing fault diagnosis on the entire of a logic circuit including a function block and an additional circuit having a scan test design to largely reduce the diagnosis processing time. <P>SOLUTION: A fail point estimation device includes: circuit dividing means 2 that receives a piece of configuration information of a scan chain including scan flip-flops in a logic circuit and a piece of design information of a logic circuit as input data 1 and extracts a circuit portion other than a parallel area in the logic circuit as a serial area to divide the logic circuit into the parallel area and a serial area; estimation value calculation means 3 that calculates a logical value in a normal circuit as an estimation value; and fault diagnosis means 4 that receives a test output on a test pattern from the logic circuit as the input data 1 and performs a fault diagnosis on the parallel area and the serial area using the test output and the estimation value of the serial area and the parallel area to output the result to an output section. <P>COPYRIGHT: (C)2013,JPO&INPIT |
