发明名称 BLOCKING THE EFFECTS OF SCAN CHAIN TESTING UPON A CHANGE IN SCAN CHAIN TOPOLOGY
摘要 A system comprises a plurality of components, scan chain selection logic coupled to the components, and override selection logic coupled to the scan chain selection logic. The scan chain selection logic selects various of the components to be members of a scan chain under the direction of a host computer. The override selection logic detects a change in the scan chain and, as a result, blocks the entire scan chain from progressing.
申请公布号 US2013103995(A1) 申请公布日期 2013.04.25
申请号 US201213712214 申请日期 2012.12.12
申请人 TEXAS INSTRUMENTS INCORPORATED;TEXAS INSTRUMENTS INCORPORATED 发明人 SWOBODA GARY L.;MCGOWAN ROBERT A.
分类号 G01R31/3177 主分类号 G01R31/3177
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