发明名称 SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To collectively form holes and slits while achieving microfabrication of the holes. <P>SOLUTION: A semiconductor device manufacturing method comprises: sequentially laminating word lines WL4-WL1 for four layers and sequentially laminating word lines WL5-WL8 for four layers so as to be juxtaposed to the word limes WL4-WL1, respectively; and penetrating the word lines WL5-WL8 with a columnar body MP1 and penetrating the word lines WL1-WL4 with a columnar body MP2 to form a NAND string NS. The word lines WL1-WL8 and select gate electrodes SGD, an SGS have a width periodically varying in a row direction. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013110295(A) 申请公布日期 2013.06.06
申请号 JP20110254854 申请日期 2011.11.22
申请人 TOSHIBA CORP 发明人 YUDA RYOTA;OBARA TAKASHI;KOTANI TOSHIYA
分类号 H01L21/8247;H01L21/336;H01L27/10;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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