发明名称 Capacitor Forming Methods
摘要 A capacitor forming method includes forming an electrically conductive support material over a substrate, forming an opening through at least the support material to the substrate, and, after forming the opening, forming a capacitor structure contacting the substrate and the support material in the opening. The support material contains at least 25 at % carbon. Another capacitor forming method includes forming a support material over a substrate, forming an opening through at least the support material to the substrate, and, after forming the opening, forming a capacitor structure contacting the substrate and the support material in the opening. The support material contains at least 20 at % carbon. The support material has a thickness and the opening has an aspect ratio 20:1 or greater within the thickness of the support material.
申请公布号 US2013140271(A1) 申请公布日期 2013.06.06
申请号 US201313753135 申请日期 2013.01.29
申请人 MICRON TECHNOLOGY, INC.;MICRON TECHNOLOGY, INC. 发明人 KIEHLBAUCH MARK
分类号 H01G13/00 主分类号 H01G13/00
代理机构 代理人
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