发明名称 METHOD FOR PRODUCING A SEMICONDUCTOR COMPONENT WITH A THROUGH-CONTACT AND SEMICONDUCTOR COMPONENT WITH THROUGH-CONTACT
摘要 Through the intermetal dielectric (2) and the semiconductor material of the substrate (1) a contact hole is formed, and a contact area of a connection metal plane (3) that faces the substrate is exposed in the contact hole. A metallization (11) is applied, which forms a connection contact (12) on the contact area, a through-contact (13) in the contact hole and a connection contact (20) on a contact area facing away from the substrate and/or on a vertical conductive connection (15) of the upper metal plane (24).
申请公布号 US2013221539(A1) 申请公布日期 2013.08.29
申请号 US201113820998 申请日期 2011.08.09
申请人 KRAFT JOCHEN;JESSENIG STEFAN;KOPPITSCH GUENTHER;SCHRANK FRANZ;TEVA JORDI;LOEFFLER BERNHARD;SIEGERT JOERG;AMS AG 发明人 KRAFT JOCHEN;JESSENIG STEFAN;KOPPITSCH GUENTHER;SCHRANK FRANZ;TEVA JORDI;LOEFFLER BERNHARD;SIEGERT JOERG
分类号 H01L23/48;H01L21/48 主分类号 H01L23/48
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