发明名称 |
ERROR DETECTION OR CORRECTION OF STORED SIGNALS AFTER ONE OR MORE HEAT EVENTS IN ONE OR MORE MEMORY DEVICES |
摘要 |
Example embodiments described herein may relate to memory devices, and may relate more particularly to error detection or correction of stored signals in memory devices.
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申请公布号 |
US2013227369(A1) |
申请公布日期 |
2013.08.29 |
申请号 |
US201213406962 |
申请日期 |
2012.02.28 |
申请人 |
BEDESCHI FERDINANDO;MICRON TECHNOLOGY, INC. |
发明人 |
BEDESCHI FERDINANDO |
分类号 |
G06F11/07 |
主分类号 |
G06F11/07 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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