发明名称 |
Drain extended MOS transistor and method for fabricating the same |
摘要 |
A drain extended MOS (DEMOS) transistor including at least one of: (1) A p-type epitaxial layer grown over an n-type semiconductor substrate. (2) An n-type well formed in a portion of the epitaxial layer. (3) A p-type drift region formed in another portion of the epitaxial layer. (4) A p-type source region formed in the well. (5) A p-type drain region formed in the drift region and spaced apart from the source region inside the epitaxial layer. (6) An n-type channel region extending between the drift region and the source region. (7) A gate structure formed over the channel region. (8) An n-type buried layer having a contact surface with the well and the drift region and formed in the epitaxial layer. A region of the buried layer has surface contact with the drift region and has a relatively low dopant concentration compared to other regions.
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申请公布号 |
US8569138(B2) |
申请公布日期 |
2013.10.29 |
申请号 |
US201213543252 |
申请日期 |
2012.07.06 |
申请人 |
LEE HEE BAE;KO CHOUL JOO;DONGBU HITEK CO., LTD. |
发明人 |
LEE HEE BAE;KO CHOUL JOO |
分类号 |
H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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