发明名称 FORMATION METHOD AND STRUCTURE FOR A WELL-CONTROLLED METALLIC SOURCE/DRAIN SEMICONDUCTOR DEVICE
摘要 A device and method for forming a semiconductor device include growing a raised semiconductor region on a channel layer adjacent to a gate structure. A space is formed between the raised semiconductor region and the gate structure. A metal layer is deposited on at least the raised semiconductor region. The raised semiconductor region is silicided to form a silicide into the channel layer which extends deeper into the channel layer at a position corresponding to the space.
申请公布号 US2013299902(A1) 申请公布日期 2013.11.14
申请号 US201313943143 申请日期 2013.07.16
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 CHENG KANGGUO;DORIS BRUCE B.;KHAKIFIROOZ ALI;SHAHIDI GHAVAM G.
分类号 H01L29/78 主分类号 H01L29/78
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