发明名称 PHOTORESIST COMPOSITION, RESIST PATTERN FORMATION METHOD, POLYMER, COMPOUND AND METHOD OF PRODUCING COMPOUND
摘要 PROBLEM TO BE SOLVED: To provide a photoresist composition superior in LWR performance, resolution, rectangularity of a cross-sectional shape, and focal depth.SOLUTION: A photoresist composition contains [A] a polymer having a structural unit represented by the following formula (1), and [B] an acid generator.
申请公布号 JP2013254084(A) 申请公布日期 2013.12.19
申请号 JP20120129404 申请日期 2012.06.06
申请人 JSR CORP 发明人 IKUI NORITO;IKEDA NORIHIKO
分类号 G03F7/039;C07D307/33;C08F24/00 主分类号 G03F7/039
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