发明名称 PHASE SHIFT MASK BLANK, MANUFACTURING METHOD THEREOF, AND PHASE SHIFT MASK
摘要 PROBLEM TO BE SOLVED: To provide a phase shift mask blank and a manufacturing method thereof capable of improving a mask service life by improving resistance to light of an optical semitransparent film (a phase shift film) composed of a material having, as main components, silicon, nitrogen, and a transition metal for exposure light of wavelength 200 nm or less, and to provide a phase shift mask.SOLUTION: A phase shift mask blank, used for creating phase shift masks to which ArF excimer laser exposure light is applied, comprises an optical translucent film 2 on a transparent substrate 1. In the phase shift mask blank, the optical translucent film 2 is composed of an incomplete nitride film having, as main components, a transition metal, silicon, and nitrogen, and the content ratio of the transition metal between the transition metal and the silicon in the optical translucent film 2 is less than 9%.
申请公布号 JP2013254206(A) 申请公布日期 2013.12.19
申请号 JP20130139879 申请日期 2013.07.03
申请人 HOYA CORP 发明人 NOZAWA JUN;SHISHIDO HIROAKI;SAKAI KAZUYA
分类号 G03F1/32;C23C14/06;G03F1/54;H01L21/027 主分类号 G03F1/32
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