发明名称 EXPOSURE DEVICE, EXPOSURE METHOD AND DEVICE MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To facilitate layout by improving freedom in disposing a head of an encoder system for measuring the position of a mobile, in a liquid immersion exposure device.SOLUTION: The exposure device comprises: a wafer stage WST disposed on a base board 12 and including scales 39A and 39B disposed on both sides of a placement area for a wafer W with respect to an X direction and with a Y direction as a length direction for forming two-dimensional grids; a local liquid immersion device for supplying liquid to under a projection optical system PL; a driving device for moving the wafer stage from one of an exposure position where liquid immersion exposure of the wafer is performed, and an exchange position of the wafer to the other position; and an encoder system including a plurality of heads 62A', 62B', 62C' and 62D' whose positions are different from one another with respect to the X direction, and measuring the position of the wafer stage with respect to three freedom directions within the XY plane through the heads opposed to the two scales, respectively.
申请公布号 JP2014003310(A) 申请公布日期 2014.01.09
申请号 JP20130162155 申请日期 2013.08.05
申请人 NIKON CORP 发明人 SHIBAZAKI YUICHI
分类号 H01L21/027;G01B11/00;G01D5/347;G03F7/20;H01L21/68 主分类号 H01L21/027
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