发明名称 |
APPARATUS FOR INSPECTING SUBSTRATE AND TRANSMISSION ILLUMINATOR FOR APPARATUS FOR INSPECTING SUBSTRATE |
摘要 |
PROBLEM TO BE SOLVED: To provide an apparatus for inspecting a substrate and a transmission illuminator for the apparatus for inspecting a substrate, which can accurately inspect a substrate by preventing an infrared light from an infrared light source from being incident on a camera without transmitting the substrate.SOLUTION: A form and a disposition of an infrared light source 2 are set so that a field of view of the infrared light source 2 by a CCD camera 6 is covered by a field of view of a substrate 1 by the CCD camera 6. By the actions of a Fresnel lens 5, an irradiation angle of an infrared light emitted from an LED element disposed in the vicinity of an end edge of the infrared light source 2 is deflected in the end edge direction of the substrate 1. Intensity of an infrared light with which the substrate 1 is irradiated from the infrared light source 2 is set larger in the end edge region of the substrate 1 than in the center of the substrate 1. |
申请公布号 |
JP2014016305(A) |
申请公布日期 |
2014.01.30 |
申请号 |
JP20120155415 |
申请日期 |
2012.07.11 |
申请人 |
SHIMADZU CORP |
发明人 |
HASHIMOTO TOYOYUKI;NAGAI MASAMICHI;HIRAIDE MASATO;TSUNASAWA YOSHIO |
分类号 |
G01N21/956;G01N21/84;H01L21/66 |
主分类号 |
G01N21/956 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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