发明名称 METHOD FOR MONITORING SURFACE OF OBJECT TO BE PROCESSED, AND MONITORING DEVICE
摘要 PROBLEM TO BE SOLVED: To make possible to grasp, by use of a relatively low-priced device, the melting state of a surface of an object to be processed which is being thermally treated by laser light including a pulsed laser light.SOLUTION: The monitoring device is a device for monitoring the condition of a surface of an object to be processed which is being thermally treated by irradiation of laser light including a pulsed laser light. The monitoring device comprises: a reference-light source for generating a reference light; a reference-light optical system for guiding the reference light from the reference-light source and irradiating the object to be processed with the reference light; a reflection-light detector unit for detecting a reflection light resulting from the reflection of the reference light by the heated object to be processed to take a surface image of the object to be processed; and a reflection-light optical system for guiding the reflection light to the reflection-light detector unit. The monitoring device irradiates the object to be processed with a pulse of reference light according to the timing of the pulsed laser light, or receives a pulse of reflection light resulting from the reflection by the object to be processed according to the timing of the pulsed laser light.
申请公布号 JP2014029965(A) 申请公布日期 2014.02.13
申请号 JP20120170556 申请日期 2012.07.31
申请人 JAPAN STEEL WORKS LTD:THE 发明人 YAMAGUCHI YOSHIHIRO
分类号 H01L21/268;H01L21/20;H01L21/66 主分类号 H01L21/268
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