发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which can stably operate even at a temperature equal to or higher than a joining temperature of a semiconductor element and easily reduces thermal resistance, and a method of manufacturing the same.SOLUTION: The semiconductor device has a semiconductor element 20, a mounting member 50, and a junction metal layer. The semiconductor element has a back metal layer on a back surface thereof. The mounting member has a wiring layer 26 provided with a recess having a planar size larger than that of the semiconductor element. The junction metal layer joins the back metal layer of the semiconductor element and at least the bottom surface of the recess together. The junction metal layer contains a solid solution comprising at least one metal selected from a first group consisting of Cu, Au, Ag, Pd, and Pt and at least one metal selected from a second group consisting of Sn, Zn, and In.
申请公布号 JP2014053384(A) 申请公布日期 2014.03.20
申请号 JP20120195536 申请日期 2012.09.05
申请人 TOSHIBA CORP 发明人 SASAKI HARUKA;TAKAGI KAZUTAKA
分类号 H01L21/52 主分类号 H01L21/52
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