发明名称 SRAM cells using shared gate electrode configuration
摘要 An SRAM cell includes a first PMOS pass transistor comprising a first gate electrode disposed on a first PMOS active region, a first NMOS pass transistor comprising a second gate electrode disposed on a first NMOS active region, a first PMOS pull-up transistor and a first NMOS pull-down transistor sharing a third gate electrode disposed on the first PMOS active region and the first NMOS active region and extending therebetween, a second PMOS pass transistor comprising a fourth gate electrode disposed on a second PMOS active region, a second NMOS pass transistor comprising a fifth gate electrode disposed on a second NMOS active region and a second pull-up transistor and a second pull-down transistor sharing a sixth gate electrode disposed on the second PMOS active region and the second NMOS active region and extending therebetween.
申请公布号 US8710592(B2) 申请公布日期 2014.04.29
申请号 US201213412211 申请日期 2012.03.05
申请人 LIM SUNME;PARK HANBYUNG;CHA HO-KWON;SAMSUNG ELECTRONICS CO., LTD. 发明人 LIM SUNME;PARK HANBYUNG;CHA HO-KWON
分类号 H01L21/8244 主分类号 H01L21/8244
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