发明名称 Lateral double diffused metal oxide semiconductor device and method of manufacturing the same
摘要 An LDMOS device includes a gate which is formed on and/over over a substrate; a source and a drain which are arranged to be separated from each other on both sides of the substrate with the gate interposed therebetween; and a field oxide film formed to have a step between the gate and the drain. The LDMOS device further includes a drift region formed of first conduction type impurity ions between the gate and the drain in the substrate; and at least one internal field ring formed in the drift region by selectively implanting a second conduction type impurity in accordance with the step of the field oxide film.
申请公布号 US8710587(B2) 申请公布日期 2014.04.29
申请号 US201113275603 申请日期 2011.10.18
申请人 MOON NAM-CHIL;YOO JAE-HYUN;KIM JONG-MIN;DONGBU HITEK CO., LTD. 发明人 MOON NAM-CHIL;YOO JAE-HYUN;KIM JONG-MIN
分类号 H01L29/78;H01L21/336;H01L29/06 主分类号 H01L29/78
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