发明名称 |
PROCEDES ET SYSTEME PERMETTANT D'EMPECHER LA FORMATION DE DEFAUT EN LITHOGRAPHIE PAR IMMERSION |
摘要 |
<p>An immersion lithography system includes an immersion fluid holder for containing an immersion fluid. The system further includes a stage for positioning a resist-coated semiconductor wafer in the immersion fluid holder and a lens proximate to the immersion fluid holder and positionable for projecting an image through the immersion fluid and onto the resist-coated semiconductor wafer. The immersion fluid holder includes a coating configured to reduce contaminate adhesion from contaminates in the immersion fluid.</p> |
申请公布号 |
FR2891065(B1) |
申请公布日期 |
2014.05.02 |
申请号 |
FR20060005774 |
申请日期 |
2006.06.27 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO.,LTD. |
发明人 |
CHANG CHING YU;LIN BURN JENG |
分类号 |
G03F7/20 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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