发明名称 PROCEDES ET SYSTEME PERMETTANT D'EMPECHER LA FORMATION DE DEFAUT EN LITHOGRAPHIE PAR IMMERSION
摘要 <p>An immersion lithography system includes an immersion fluid holder for containing an immersion fluid. The system further includes a stage for positioning a resist-coated semiconductor wafer in the immersion fluid holder and a lens proximate to the immersion fluid holder and positionable for projecting an image through the immersion fluid and onto the resist-coated semiconductor wafer. The immersion fluid holder includes a coating configured to reduce contaminate adhesion from contaminates in the immersion fluid.</p>
申请公布号 FR2891065(B1) 申请公布日期 2014.05.02
申请号 FR20060005774 申请日期 2006.06.27
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO.,LTD. 发明人 CHANG CHING YU;LIN BURN JENG
分类号 G03F7/20 主分类号 G03F7/20
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