| 摘要 |
The present invention relates to a panel appearance inspecting device and an inspecting method using the same, capable of further increasing the efficiency and accuracy of a panel appearance inspection process by automatically setting an appearance inspection target area for each image in the pre-processing step for obtaining images of substrates or panels and detecting and identifying a defect on the appearance, and more specifically, to a panel appearance inspecting device and an inspecting method using the same comprising a supporting unit on which a substrate or a panel is mounted; an image extracting unit for generating photographed images of the mounted substrate or panel; a pre-processing unit for extracting edge points and representative lines of the edge points from the photographed images and setting the final inspection areas of the photographed images; an inspecting unit for analyzing the final inspection areas of the photographed images and identifying defective photographed substrates or panels; and a control unit for monitoring the performance of the image extracting unit, pre-processing unit, and inspecting unit and controlling the activities of the image extracting unit, the pre-processing unit and the inspecting unit. |
