发明名称 ABNORMALITY DETECTION DEVICE AND ABNORMALITY DETECTION PROGRAM AND ABNORMALITY DETECTION METHOD
摘要 <p>PROBLEM TO BE SOLVED: To provide an abnormality detection device capable of performing accurate abnormality detection in the case of conveying a card having irregularity.SOLUTION: The abnormality detection device includes: conveyance means 400 for conveying an abnormality detection object acquired from insertion means; thickness measurement means 500 for measuring the thickness of the abnormality detection object at a plurality of predetermined positions in a conveyance direction; design thickness storage means 6 for storing the thickness of the position of the design thickness of the abnormality detection object; and abnormality determination means 7 for detecting a difference between the thickness of the abnormality detection object measured by the thickness measurement means 500 at any of the plurality of predetermined positions and the design thickness corresponding to the position stored in the design thickness storage means 6. When the abnormality determination means 7 detects the difference which exceeds a predetermined threshold, the conveyance means returns the abnormality detection object to the insertion means.</p>
申请公布号 JP2014102201(A) 申请公布日期 2014.06.05
申请号 JP20120255423 申请日期 2012.11.21
申请人 NEC COMPUTERTECHNO LTD 发明人 KIMURA YASUNORI
分类号 G01B5/06;B07C5/06;B07C5/08;G07D9/00 主分类号 G01B5/06
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