| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a fluorescent X-ray analyzing apparatus that can easily and accurately measure a sample in a short period of time even if the center of the sample is convex or concave. <P>SOLUTION: A fluorescent X-ray analyzing apparatus comprises: optical element selecting means 3 that measures with an X-ray detector 7 the intensity of a secondary X-ray 4 generated by irradiating a sample S with a primary X-ray 2 from an X-ray source 1 and selects, regarding optical elements on the optical paths of the primary X-ray 2 and the secondary X-ray 4, a first optical element 31 or a second optical element 32; intensity ratio/sample height memory means 8 that stores a pre-figured-out correlation of the intensity ratio between the intensity of the secondary X-ray at the first optical element and the intensity of the secondary X-ray at the second optical element versus a sample height; and intensity correcting means 9 that applies, regarding an unknown sample S, the intensity ratio between the intensity of the secondary X-ray at the first optical element and the intensity of the secondary X-ray at the second optical element to the correlation stored by the memory means 8, thereby figures out the sample height, and corrects the intensity of the secondary X-ray at the first optical element 31 accordingly. <P>COPYRIGHT: (C)2013,JPO&INPIT</p> |
