| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a three-dimensional measuring system capable of making appropriate three-dimensional measurement by easily adjusting relative positions of principal points of a projection device and an imaging device.SOLUTION: A line pattern 407 passing through an intersection of a perpendicular from a principal point 402 of a projection device onto a projection element surface 401 is projected onto a reference object 108 constituted of a three-dimensional structure having a plurality of surfaces. If this line pattern 407 does not match an epipolar line 406 at which epipolar planes 408 according to arrangement of principal points 402 and 404 of the projection device and an imaging device and the projection element surface 401 intersect, the line pattern 407 deviates from a line on an imaging element surface 403 of the imaging device. Therefore, adjustment information on relative positions of the principal points 402 and 404 are calculated and notified so that a pattern on the projection element surface 401 is a line. If the relative positions of the principal points 402 and 404 are controlled so that the line pattern 407 matches the epipolar line 406 according to the notification, the pattern can be easily searched on the imaging element surface 403. This can improve feature point recognition accuracy and ensure highly accurate calibration.</p> |
