发明名称 METHOD FOR FABRICATING AN INTEGRATED DEVICE
摘要 A method for fabricating an integrated device includes the following steps. First, a multi-layered structure is formed on a substrate, wherein the multi-layered structure is embedded in a lower isolation layer. Then, a bottom conductive pattern and a top conductive pattern are formed on a top surface of the lower isolation layer, wherein the top conductive pattern is on a top surface of the bottom conductive pattern. Afterwards, portions of the top conductive pattern are removed to expose portions of the bottom conductive pattern. Subsequently, an upper isolation layer is deposited on the lower isolation layer so that the upper isolation layer can be in direct contact with the portions of the bottom conductive pattern. Finally, portions of the lower isolation layer and the upper isolation layer are removed so as to expose portions of the substrate.
申请公布号 US2015011035(A1) 申请公布日期 2015.01.08
申请号 US201313933135 申请日期 2013.07.02
申请人 UNITED MICROELECTRONICS CORP. 发明人 Wang Kuan-Yu;Wu Hui-Min;Hsieh Kun-Che
分类号 B81C1/00 主分类号 B81C1/00
代理机构 代理人
主权项 1. A method for fabricating an integrated device, comprising: providing a multi-layered structure on a substrate, wherein the multi-layered structure is embedded in a lower isolation layer; forming an upper conductive pattern on a top surface of the lower isolation layer, wherein the upper conductive pattern comprises a bottom conductive pattern and a top conductive pattern disposed on a top surface of the bottom conductive pattern; removing portions of the top conductive pattern to expose portions of the bottom conductive pattern; blank forming an upper isolation layer on the lower isolation layer, wherein the upper isolation layer is in direct contact with the portions of the bottom conductive pattern; and removing portions of the lower isolation layer and the upper isolation layer to expose portions of the substrate.
地址 Hsin-Chu City TW